Graphite electrode surface degradation mechanisms and formation of solid electrolyte layers (SEI) at the interface with the electrolyte were studied as a function of the applied voltage and voltage scan rates using in situ optical microscopy. Voltammetry tests were initiated from a peak voltage of 3.00 V during which the voltage was decreased to a constant base potential (0.02 V) using different scan rates of 0.05-5.00 mV/s. Cross-sectional FIB microscopy indicated that graphite surface and subsurface damage -- in the form of loss of material from graphite -- was reduced when dense and continuous deposits of SEI formed at low scan rates (e.g. 0.05 mV/s).Whereas, non-uniform and discontinuous SEI formed at high scan rates (∼ 5.00 mV/s) was unable to alleviate graphite surface damage.